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semiconductor
2026/03/27
How are surface topography and roughness measured after pulsed laser processing?
White-light interferometer for precise and efficient measurement of surface topography, roughness, step height, volume, and other parameters after laser processing.
White-light interferometer for precise, efficient measurement of post-laser-processing surface topography, roughness, step height, volume, and other parameters. Nanometer-level accuracy ensures quality control while enabling reverse optimization of processing parameters to improve product yield by 30%.
Customer Background
A Laser Processing Enterprise
Customer Challenges
Measuring surface roughness after laser processing is challenging; traditional contact methods can easily scratch the sample.
Solution
Adopts a non-contact white light interferometry approach to achieve nanometer-precision surface topography analysis.
Application Outcomes
Measurement efficiency increased by 5x, product yield improved by 30%, and processing parameter optimization time reduced by 60%.
